应我校金沙检测线路js69徐光华教授邀请，香港城市大学系统工程与工程管理学院(SEEM)Ir. Dr. Peter W. Tse博士来我校进行学术交流，并为我校师生举办无损检测方面的讲座。讲座的相关安排如下：

讲座人：Ir. Dr. Peter W. Tse博士

题目: Recent trends in non-destructive testing, quality inspection and smart sensordesign.

时间：2012年11月17日 上午10:00

地点：机械制造系统工程国家重点实验室，交大曲江校区西五楼A424会议室

讲座人简介： Ir Dr. Peter W. Tse is a Fellow of the American Society of Mechanical Engineers and a Founder Fellow of the International Society of Engineering Asset Management. He obtained his B.Eng. and M.Sc. from Canada and his Ph.D. from United Kingdom. He is currently the Deputy Director of the Deputy Director, Centre for Systems Informatics Engineering (CSIE), the Director of Croucher Optical Nondestructive Testing (CNDT) Laboratory and the Smart Engineering Asset Management Laboratory (SEAM) at the City University of Hong Kong. He is a Chartered Engineer in United Kingdom and a Professional Engineer in Canada. He is also the O-Committee Member of several ISO’s Technical Committees. Currently he is an Adjunct Professor of the University of Electronic Science and Technology of China, a former Guest Professor of the Wuhan University of Technology and Adjunct Professor of the Beijing University of Technology. As of today, he has published more than 250 articles in various journals and proceedings. Currently, his research outcomes have been applied to over 30 local and international companies 欢迎有兴趣的师生届时听讲座。研究生记学分。